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Focused ion beam
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71	SIMS – Basic Concepts & Design The Basics Secondary Ion Mass Spectrometry (SIMS), also known as the ion probe, is a ‘destructive’ analytical technique. This means that part of the sample is physically removed by th Add to Reading List Source URL: jdlc.curtin.edu.au Language: English - Date: 2015-03-22 22:48:10 Laboratory techniques Secondary ion mass spectrometry Ion source Sensitive high-resolution ion microprobe Sputtering Sector instrument Ion Static secondary-ion mass spectrometry Focused ion beam Chemistry Mass spectrometry Scientific method
72	Microsoft Word - MCEM Manual 2014 version 2.12.doc Add to Reading List Source URL: mcem.monash.edu.au Language: English - Date: 2014-06-24 02:06:41 Microscope Electron microscope Transmission electron microscopy Microscopy Scanning electron microscope Focused ion beam Membership of the College of Emergency Medicine Centre for Advanced Microscopy Scientific method Electron microscopy Science
73	EC Letter Template - English Version [removed]EC Letter Template - English Version Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2014-11-21 07:57:24 Focused ion beam Electron microscope Bruker Transmission electron microscopy JEOL Microscope Microscopy Scanning electron microscope Scientific method Electron microscopy Science
74	Focused Ion Beam Technology and Applications to Microelectronics Add to Reading List Source URL: rs.ieee.org Language: English - Date: 2011-07-27 12:12:51 Semiconductor device fabrication Thin film deposition Physics Failure Focused ion beam Ion beam Fib Failure analysis Electron microscope Scientific method Science Electron microscopy
75	ews 3D micro/nano-polymerised black silicon and Image of the Year Researchers at MCN have pioneered an approach that produces intricate structures with micro/nano-polymerisation using the highly refractive long thin nano Add to Reading List Source URL: nanomelbourne.com Language: English - Date: 2013-04-11 20:48:14 Physics Focused ion beam Scanning electron microscope Melbourne Centre for Nanofabrication Thin film Electron microscope Corrosion Microelectromechanical systems Laser Science Scientific method Electron microscopy
76	OPEN SUBJECT AREAS: MATERIALS SCIENCE Maskless milling of diamond by a focused oxygen ion beam Add to Reading List Source URL: www.nature.com Language: English - Date: 2015-03-10 06:09:20 Materials science Electron microscopy Semiconductor device fabrication Thin film deposition Ions Focused ion beam Ion beam Ion implantation Electron microscope Chemistry Scientific method Science
77	FEI Dual-‐beam SEM/FIB Quanta 3D FEG A focused Ion-‐beam (FIB) for nano-‐ and micro-‐scale cu@ng and removal of material, usefu Add to Reading List Source URL: nanomelbourne.com - Date: 2013-02-20 23:32:12
78	Meso-Machining Manufacturing Technologies Meso-machining technologies being developed at Sandia National Laboratories will help manufacturers improve a variety of production processes, tools, and components. Meso-machini Add to Reading List Source URL: www.sandia.gov Language: English - Date: 2006-04-17 11:56:56 Machining Electromagnetism Semiconductor device fabrication Mechanical engineering Microelectromechanical systems Transducers Electrical discharge machining Focused ion beam Electroforming Materials science Technology Microtechnology
79	PDF Document Add to Reading List Source URL: nanomelbourne.com Language: English - Date: 2012-08-28 20:57:02 Electron microscopy Science Semiconductor device fabrication Thin film deposition Focused ion beam Scientific method Fib Melbourne Centre for Nanofabrication
80	Fab-in-a-Box: Direct-write-Nanocircuits Jaebum Joo and Joseph M. Jacobson Molecular Machines, Media Lab Massachusetts Institute of Technology, Cambridge, MA Add to Reading List Source URL: cba.mit.edu Language: English - Date: 2011-12-13 18:52:44 Science Semiconductor device fabrication Nanolithography Nanocircuitry Focused ion beam Transistor Dip-pen nanolithography Photolithography Materials science Microtechnology Technology

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